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Surface Analysis Methods in Materials Science

Springer Series in Surface Sciences 23

Erschienen am 01.12.2010, 2. Auflage 2003
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Bibliografische Daten
ISBN/EAN: 9783642074585
Sprache: Englisch
Umfang: xxvi, 585 S.
Einband: kartoniertes Buch

Beschreibung

This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. Each chapter has been written by specialists in the field who draw on their experience in current developments and applications. This book is aimed at industrial scientists and engineers in research and development seeking a description of available techniques in a concise but informative style. It is invaluable as a comprehensive text for scientists and engineers attending training courses and workshops. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.

Autorenportrait

InhaltsangabeI Introduction.- 1 Solid Surfaces, Their Structure and Composition.- 2 UHV Basics.- II Techniques.- 3 Electron Microscope Techniques for Surface Characterization.- 4 Sputter Depth Profiling.- 5 SIMS - Secondary Ion Mass Spectrometry.- 6 Auger Electron Spectroscopy and Microscopy - Techniques and Applications.- 7 X-Ray Photoelectron Spectroscopy.- 8 Vibrational Spectroscopy of Surfaces.- 9 Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis.- 10 Materials Characterization by Scanned Probe Analysis.- 11 Low Energy Ion Scattering.- 12 Reflection High Energy Electron Diffraction.- 13 Low Energy Electron Diffraction.- 14 Ultraviolet Photoelectron Spectroscopy of Solids.- 15 EXAFS.- III Processes and Applications.- 16 Minerals, Ceramics and Glasses.- 17 Characterization of Catalysts by Surface Analysis.- 18 Application to Semiconductor Devices.- 19 Characterisation of Oxidised Surfaces.- 20 Coated Steel.- 21 Thin Film Analysis.- 22 Identification of Adsorbed Species.- 23 Surface Analysis of Polymers.- 24 Glow Discharge Optical Emission Spectrometry.- IV Appendix.- Acronyms Used in Surface and Thin Film Analysis.- Surface Science Bibliography.

Inhalt

Part I: Introduction: Solid Surfaces, Their Structure and Composition.- UHV Basics.- Part II: Techniques: Electron Microscope Techniques.- Sputter Depth Profiling.- SIMS.- AES.- XPS.- Vibrational Spectroscopy.- RBS.- Scanned Probe Analysis.- Low Energy Ion Scattering.- RHEED.- LEED.- UPS.- EXAFS.- Part III: Processes and Applications Minerals, Ceramics and Glasses.- Catalysts.- Semiconductor Devices.- Oxidised Surfaces.- Coated Steel.- Thin Films.- Adsorbed Species.- Polymers.- Glow Discharge Optical Emission Spectrometry.

Schlagzeile

2nd edition